電気学会論文誌C(電子・情報・システム部門誌)
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
多重原子群モデルによる誘電体境界面におけるX線散乱のBEM解析
辻本 眞一郎宮崎 保光
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ジャーナル フリー

1999 年 119 巻 1 号 p. 105-110

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Recently X-rays are the focus of the next generation technologies. The development of X-ray optics, with the advent of the UNDULATOR such as SOR (Synchrotron Orbital Radiation), has been remarkable. X-ray optical devices are forced to step up the efficiency, and lenses, reflection mirrors and guides are being studied in the X-ray active region. In this paper scattering analysis is carried out by using wavelength of X-ray, and parameters such as radius of atoms, distance between atoms, angle of incidence X-ray. The model of atoms are considered to be cylindrical perfect conductor and dielectric, and we considered up to 15×15 cylinders using calculations based on the BEM technique.
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