Measurement and Validation of Conversion Factor of Magnetic Near-field Probe Directly above Microstrip Line

Abstract

The conversion factor (CF) of a magnetic near field probe directly above a microstrip line (MSL) is derived in conjunction with the arrangement dimensions and the S parameters, which is validated by comparing the CF provided by Langer and the previously presented CF based on time-domain-reflectometer response. Further validity is verified by comparing the spatially averaged magnetic field converted via the derived CF and the magnetic field at the loop center of the probe on the MSL excited by a 500 V charging ESD generator.