IEEJ Journal of Industry Applications
Online ISSN : 2187-1108
Print ISSN : 2187-1094
ISSN-L : 2187-1094

この記事には本公開記事があります。本公開記事を参照してください。
引用する場合も本公開記事を引用してください。

A Small and High Efficiency Circuit Topology with Significantly Improved Trade-off Between Switching Losses and dv/dt for Series Connected Devices with Regenerative Snubber Circuits
Koji MakiHiroshi Mochikawa
著者情報
ジャーナル フリー 早期公開

論文ID: 22000380

この記事には本公開記事があります。
詳細
抄録

This paper proposes a small and high efficiency circuit topology for series connected devices with regenerative snubber circuits. The proposed circuit topology introduces an important break-through in the trade-off between switching losses and dv/dt. Regenerative snubber circuits store most of the switching losses that occur in general circuits and regenerate at high efficiency. A 10kW-200V class prototype of the proposed circuit topology recorded a maximum efficiency of 99.49%, and a rated efficiency of 99.21%. Loss analysis of the prototype demonstrated no reduction in efficiency due to the regenerative operation by regenerative snubber circuits.

著者関連情報
© 2022 The Institute of Electrical Engineers of Japan
feedback
Top