IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Special Issue Paper
High Quality GaAs on Si Substrate by Epitaxial Lift-off Using SeS2 and its Application to Devices
Hironori TaguchiTetsuo SogaTakashi JimboMasayoshi Umeno
Author information
JOURNAL FREE ACCESS

2003 Volume 123 Issue 12 Pages 553-559

Details
Abstract
A new method of chemical bonding for GaAs on Si has been developed using SeS2. The bonding between GaAs and Si is very robust and withstands many processing steps. Using the epitaxial lift off (ELO) technique the thin film of GaAs is grafted to Si substrate. The film bonded by this method has longer minority carrier lifetime than heteroepitaxial GaAs film on Si. The current-voltage(I-V)characteristics of p-GaAs/n-Si, n-GaAs/n-Si, p-GaAs/p-Si and n-GaAs/p-Si were measured at room temperature. The I-V curve did not show a rectifying behavior when GaAs was bonded to Si with SeS2 because of the formation of a high-resistance layer at the interface. The characteristics were greatly improved bsuby small additions of Sn to SeS2 during the bonding process. The very low resistance is obtained with adding Sn in SeS2 during the bonding. The properties of solar cells using this method were compared with those grown on Si substrate by heteroepitaxy and GaAs substrate.
Content from these authors
© 2003 by the Institute of Electrical Engineers of Japan
Previous article Next article
feedback
Top