IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Special Issue Review
Precision Measurement of Positioning on the Desktop Microrobot Factory
-Towards Production System for Nanotechnology-
Ohmi Fuchiwaki
Author information
JOURNAL FREE ACCESS

2004 Volume 124 Issue 12 Pages 449-452

Details
Abstract
Today, there is variety of “nanotechnology” field such as semiconductor, biochemistry, material and so on. However, measurement and sensing technologies in nano-scale positioning are common technologies for establishing nanotechnology in each field. In this report, precise measurement technologies in positioning for “Desktop micro robots factory” are described. Non-contact position measurement techniques such as image tracking, optical encoder, and magnetic encoder are reviewed. By employing several measurement techniques in position measurement, it enables cm order to nm order positioning seamlessly. Some advantages of “Desktop micro robots factory” as a production system for nanotechnology are also reviewed.
Content from these authors
© 2004 by the Institute of Electrical Engineers of Japan
Next article
feedback
Top