論文
Non-Mutative Cell Viability Measurement on an IGZO Transparent Thin Film Transistor Electrode Array
2020 年 140 巻 8 号 p. 193-200
詳細
2020 年 140 巻 8 号 p. 193-200
In this work we present the use of a transparent thin film transistor (tTFT) substrate to perform non-mutative cell viability measurements through purely electrical means. This is done through the measurement of the impedance of a region of the cellular culture and monitoring its change. By mapping this with simultaneous fluorescent measurements we managed to build predictive models for cell viability that obviate the need for mutative dyes while still enabling their use for simultaneous or subsequent measurement.
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