電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
論文
ナノギャップデバイスによる真空度測定の検討
小宮 一毅永田 晃基山岡 英彦伊達 修一宮下 惟人楊 明
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2023 年 143 巻 12 号 p. 391-394

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Advances in microfabrication technology have enabled electron beam lithography (EB lithography) systems to produce microfabrication on the order of tens of nanometers. Using this technology, we have fabricated nanogap electrodes that can generate large electric fields at low voltages. The gap between the tips of the fabricated electrodes is 100 nm, and the curvature of each tip is 50 nm. The device was confirmed to work as an electronic vacuum gauge, The device successfully measured vacuum from 10-3 Pa to 1 Pa at the electrode voltage of 3 V.

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