IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
3-D Inspection System for Small Defects on Arbitrarily Curved Surfaces
Akira KIMACHITakayuki ONUMAShigeru ANDO
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1997 Volume 117 Issue 4 Pages 215-221

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Abstract
This paper describes a three-dimensional (3-D) inspection system for small 3-D and reflectance defects of an arbitrary surface. We fix a TV camera in front of the object, and along the viewing axis we move a random dot projector at a constant speed. After taking the first image sequence, we shift the object by a slight known amount, and take the second image sequence in the same way. Applying the spatio-temporal gradient method, we extract gradient patterns of surface depth and surface reflectance distributions. We applied this method to visual inspection and classification of fine surface defects such as cracks, flaws, stain, and rust. We show this system could detect up to 5μm flaws and 1% reflectance change from a 50cm distant measuring apparatus.
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© The Institute of Electrical Engineers of Japan
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