電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Non Destructive Testing using the SQUID with Integrated Gradiometer
H. NakaneH. AdachiM. WalkerU. Klein
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1998 年 118 巻 1 号 p. 37-41

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We have used the integrated SQUID gradiometer in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. The sensor consists of a niobium dc superconducting quantum interference device (SQUID) and a first-order gradiometer pick up coil on the same substrate. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen or cryostat.
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© The Institute of Electrical Engineers of Japan
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