10-4 アモルファスシリコンpin光電変換膜の過剰雑音特性

秋山 正弘; 澤田 和明; 高尾 英邦; 石田 誠

doi:10.11485/iteac.2000.0_141

PROCEEDINGS OF THE ITE ANNUAL CONVENTION

Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846

2000

Session ID : 10-4

DOI https://doi.org/10.11485/iteac.2000.0_141

Conference information

Name : 2000 ITE Annual Convention

Location : [in Japanese]

Date : August 23, 2000 - August 25, 2000

10-4 Noise characteristics in amorphous silicon pin photoconversion Films

Masahiro Akiyama, Kazuaki Sawada, Hidekuni Takao, Makoto Ishida

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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

The photocurrent multiplication was observed in amorphous silicon pi photoconversion films. This noise characteristics was followed in Mclintyre's equation because excess noise factor wad greater than unit. The result indicates that photocurrent is multiplied by avalanche multiplication phenomenon.

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