Crystallographic Orientation Effect of Seedlayers Deposited by ECR Sputtering Method on Co-Cr-Pt Longitudinal Recording Media

Abstract

Crystallographic and magnetic properties are investigated for Co-Cr-Pt/Cr-Ti longitudinal media fabricated on MgO and Cr seedlayers prepared by Electron Cyclotron Resonance (ECR) sputtering method. The MgO and Cr layers deposited at room temperature show well developed {100} texture. Highly (100)-oriented Cr-Ti and (11.0)-oriented Co-Cr-Pt layers are epitaxially grown on the seedlayers. The ECR-deposite seedlayers are useful to prepare Co-Cr-Pt media with high coercivity and small crystal grain diameter.