A Time-Resolved NIRS Measurement using High Time-Resolution CMOS Lock-In Pixel Image Sensor

Zhonghui Liu; Min-Woong Seo; Masatsugu Niwayama; Keiichiro Kagawa; Keita Yasutomi; Shoji Kawahito

doi:10.11485/itetr.40.40.0_11

40.40 Information Sensing Technologies(IST)

セッションID: IST2016-53

DOI https://doi.org/10.11485/itetr.40.40.0_11

会議情報

主催: Information Sensing Technologies(IST)

会議名: 情報センシング

開催日: 2016/11/17

A Time-Resolved NIRS Measurement using High Time-Resolution CMOS Lock-In Pixel Image Sensor

*Zhonghui Liu, Min-Woong Seo, Masatsugu Niwayama, Keiichiro Kagawa, Keita Yasutomi, Shoji Kawahito

著者情報

キーワード: NIRS, TRS, fitting method, light propagation formula, scattering coefficient

会議録・要旨集フリー

詳細

抄録

A CMOS lock-in pixel image sensor with lateral electric field charge modulation (LEFM) is used for time-resolved NIRS (near-infrared spectroscopy) measurement. The developed imager with LEFM achieves a very high time-resolution of tens of picoseconds and a very short intrinsic response time of hundreds of picoseconds. These sensor characteristics help to measure the absorption and scattering coefficients of the biological tissues as well as highly time-resolved images.

責任著者(Corresponding author)

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