Proceedings of the Japan Joint Automatic Control Conference
48th Proceedings of the Japan Joint Automatic Control Conference
Session ID : J1-26
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Development of the Measurement method for raw silk size by using Laser Scanning Micrometer
*HIDEAKI MORIKAWAKouhei TuruokaMikihiko MiuraMasayuki Iwasa
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2005 JACC Organizing Committee
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