抄録
Fault frequency of LSI is increased by the effects of process shrinking and density growth.
We focus on the reconfigurability of SRAM-based field programmable gate arrays (FPGAs) which is programmable LSI.
FPGAs have a capability of hard error avoiding by reconfiguration.
Although FPGAs may recover from hard error without replacing the chip, recovery procedure is not established.
In addition, FPGAs are vulnerable to soft error.
Therefore, we propose a dependable system that can recover from both soft and hard errors using triple modular redundancy and partial reconfiguration.