主催: 電気・情報関係学会九州支部連合大会委員会
会議名: 平成30年度電気・情報関係学会九州支部連合大会
回次: 71
開催地: 大分大学
開催日: 2018/09/27 - 2018/09/28
The increase of series resistance can represent the photovoltaic system degradation, the I-V characteristics deviation. The maximum series resistance in STC is an important value to consider the I-V characteristics deviation. In this study, series resistance yielding value is calculated by modeling an equivalent circuit in LT spice. The coefficient of resistance, k, was calculated through the open circuit voltage and the short circuit current in all irradiance levels. This study is a new approach to series resistance yielding value that occurs deviation of the photovoltaic I-V characteristic.