材料と環境
Online ISSN : 1881-9664
Print ISSN : 0917-0480
ISSN-L : 0917-0480
金属腐食と半導体腐食の比較
佐藤 教男
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ジャーナル フリー

2005 年 54 巻 3 号 p. 92-98

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Metallic corrosion and semiconductor corrosion are both subject to the local cell model, in which the energy levels of electrons and holes are determinant in the corrosion. In metals available electrons and holes locate at the same level of electrode potential: whereas, in semiconductors they locate at their respective levels different from the electrode potential. Electron-associated corrosion and hole-associated one are indistinguishable with metals but take place in different ways with semiconductors depending on whether of p-type or n-type. Photo-effects on corrosion are negligible with metals but are significant with semiconductors. The corrosion of metals may be inhibited in contact with n-type semiconductors, while it may be accelerated with p-type semiconductors.
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