日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
特集 結晶学と情報学の融合
スパース・モデリングを用いた広域X線吸収微細構造の解析
赤井 一郎岩満 一功五十嵐 康彦岡田 真人瀬戸山 寛之岡島 敏浩
著者情報
ジャーナル フリー

2020 年 62 巻 1 号 p. 2-9

詳細
抄録

We propose a new method to extract the informations of microscopic structure from the extended X-ray absorption fine structure by the application of sparse modeling based on a simplified single-scattering approximation of photo-electron waves. This method can extract the sparse radial distribution function of the atoms located nearby the target atom and can estimate the Debye-Waller factor without any assumption of the micro-structures. Therefore, this method is expected to exhibit considerable ability in the crystallographic researches on new materials and such cooperative researches of data-driven science and crystallographic measurements are strongly expected to extend the frontiers in various research fields.

著者関連情報
© 2020 日本結晶学会
前の記事 次の記事
feedback
Top