特集 結晶学と情報学の融合
データ駆動型アプローチによる放射光全散乱計測
2020 年 62 巻 1 号 p. 26-34
詳細
2020 年 62 巻 1 号 p. 26-34
A data-driven approach to X-ray response non-uniformity in photon-counting detectors, which is referred to as ReLiEf （Response to Light Effector）, has been developed to realize synchrotron total-scattering measurements for materials with both crystalline and non-crystalline domains. A total-scattering measurement system corrected by ReLiEf, which is called OHGI （Overlapped High-Grade Intelligencer）, can give wide-Q-range （0.1～31 Å－1） and small-Q-step （10－3 Å－1） data with an accuracy of 0.2％ by a single measurement.
