連載企画 X線結晶学者のためのクライオ電子顕微鏡解析の手引き
クライオ電子顕微鏡単粒子解析の実際～試料調製から画像解析まで～
2021 年 63 巻 2 号 p. 89-96
詳細
2021 年 63 巻 2 号 p. 89-96
Recent marked development called “Resolution revolution” has made cryo-electron microscopy （Cryo-EM） the third method of structure determination at atomic resolution next to X-ray crystallography and NMR. In this review, actual situation surrounding Cryo-EM including an outline about the workflow from sample preparation to image analysis and differences between Cryo-EM analysis and X-ray crystallography is introduced. We hope that this review is useful for researchers particularly who will start Cryo-EM analysis.
