MO観察で特定したYBCO線材欠陥部位のSIM及びTEMによる微細構造観察

抄録

We have developed a defect analysis procedure that combines a magneto-optical (MO) imaging system with scanning ion microscopy (SIM) and transmission electron microscopy (TEM). Low I_c areas of coated conductors were inspected using the MO imaging system. The defective area revealed in the MO image was prepared for cross-sectional SIM specimen using a focused Ga ion beam. The porous YBCO layers were found by SIM observation. Furthermore, defective areas were picked up using micro-sampling and then thinned using a focused Ga ion beam. TEM observation and energy dispersive X-ray spectroscopy indicated that the YBCO layers were composed of Y-rich phases and Ba-Cu-O.