低温工学
Online ISSN : 1880-0408
Print ISSN : 0389-2441
ISSN-L : 0389-2441
研究論文
柱状欠陥を導入したYBa2Cu3Oy超伝導薄膜における電界-電流密度特性の磁場角度依存性
藤吉 孝則末吉 哲郎春田 正和米倉 健志池上 知顯石川 法人淡路 智渡辺 和雄
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2009 年 44 巻 12 号 p. 517-522

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The effects of columnar defects on the critical current density (Jc) and electric (E) vs. current density (J) characteristics were investigated for a YBa2Cu3Oy thin film prepared using a pulsed-laser deposition method. The YBa2Cu3Oy thin film was irradiated with 200 MeV Au ions from a direction θ=8.8°off the c-axis. Two peaks in the angular dependence of Jc were observed at the angles of θ=8.8°and θ=90°. These angles correspond to the directions of the columnar defect and intrinsic pinning, respectively. The E-J characteristics at various magnetic field angles can be described by the percolation transition model. The value of pinning parameter m increases at the angles of θ=8.8°and θ=90°. This result indicates that the efficiency of flux pinning is enhanced because fluxoids are effectively pinned by the columnar defects and intrinsic pinning or stacking faults in these directions.

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© 2009 公益社団法人 低温工学・超電導学会 (旧 社団法人 低温工学協会)
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