Transactions of The Japan Institute of Electronics Packaging
Online ISSN : 1884-8028
Print ISSN : 1883-3365
ISSN-L : 1883-3365
Short Note
QFP/quartz Adhesive Bonding with Surface Treatment for Physical Security of Edge Artificial Intelligence Devices
Hiro NodakaAmi TezukaHiroyuki KuwaeKosuke YamadaMorihisa HogaHaruo ShimamotoShuichi ShojiJun Mizuno
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2020 年 13 巻 p. E20-008-1-E20-008-4

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We studied a method of quad flat package (QFP)/quartz adhesive bonding. This bonding technology is required for developing physical security of edge artificial intelligence (AI) devices using a nanoartifact metrics (NAM) chip. Relationships between contact angle and bonding strength of QFP/adhesive or quartz/adhesive were investigated under several surface treatment methods including vacuum ultraviolet (VUV) treatments, and plasma treatments. VUV irradiation in the presence of nitrogen gas (VUV/N2) treatment reduced the contact angle of the QFP and quartz surface from 99.2° to 5.0°, which improved QFP/adhesive bonding strength 5.7 times. Furthermore, the bonding strength of QFP/adhesive/quartz bonding with the VUV/N2 treatment shows a shear strength of 14.2 MPa. It is 2.4 times higher value than that without the treatment. These results are a promising step for highly reliable QFP/quartz bonding.

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© 2020 The Japan Institute of Electronics Packaging
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