透過型単色器による錫単結晶下部組織のX線的研究

抄録

Investigation on substructures in single crystals grown from molten tin was carried out by a very thin bent-quartz monochromater of the transmission type. Some of the streaks of the banding structure, which had been found microscopically, were also observed as defects by this technique in the specimens grown at slow speeds by using zone-refined high-purity tin. The X-ray reflection line from the portion of the specimen which solidified at the later stage was the sharpest and the most linear in shape and the one from the portion which solidified at the earlier stage was broader than the others and broken at several points. The marrowest width of the reflection lines from the specimen with the growing speed of 0.05 mm/min and the temperature gradient of 13/cm was about 30 sec of arc. The width of the reflection line broadened with increasing speed of growth.