Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Absolute Measurement of the Density of Silicon Crystals for a Determination of the Avogadro Constant
K. FujiiY. NezuM. Tanaka
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1998 Volume 25 Issue 3 Pages A105-A108

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Abstract
A determination of the Avogadro constant NA by the X-ray crystal density (XRCD) method is described, where the density p of silicon crystals has been determined with a relative uncertainty of 1.1×10^<-7> by the interferometric measurements of the diameters of 1-kg silicon spheres. Recent results on the molar volume M/p of silicon crystals suggest that a large number of microscopic defects are contained in the crystals.
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© 1998 The Japanese Association for Crystal Growth
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