ATR Mode of Surface Exciton Polaritons in ZnO Thin Film

抄録

ATR analysis (Kretschmann configuration) has been carried out for c1-surface exciton polaritons (SEP’s) in anisotropic ZnO thin films. The effect of additional boundary conditions (ABC’s) on ATR spectra due to the SEP’s has been discussed. We employ two typical types of ABC’s, i.e. Kliewer-Fuchs type and Rimbey-Mahan type. The numerical calculations have clearly shown that the ATR spectra for frequency scans are strongly affected by the form of ABC’s.