Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument

Dhananjay I. Patel; Paul Dietrich; Andreas Thißen; Matthew R. Linford

doi:10.1384/jsa.26.162

Extended Abstracts from 8th International Symposium on Practical Surface Analysis (PSA19)

Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument

Dhananjay I. Patel, Paul Dietrich, Andreas Thißen, Matthew R. Linford

著者情報

ジャーナルフリー

2019 年 26 巻 2 号 p. 162-163

DOI https://doi.org/10.1384/jsa.26.162

詳細

抄録

Near ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) is an advanced version of traditional XPS. NAP- XPS works at relatively high pressures, which allows many types of samples to be analyzed. Here we show NAP-XPS analyses of various non-traditional materials and describe advantages and unique features of the technique.

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