Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
- New Instrumentations and Techniques -
Reference Auger Electron Spectra with Work Function Corrected
Y.Z. JiangW.Y. LiK. GotoR. Shimizu
著者情報
ジャーナル フリー

2002 年 9 巻 3 号 p. 348-352

詳細
抄録
An iteration method in the energy calibration of AES has been developed by using elastically backscattered primary electrons with possibility of 15 meV (σ) for the energy range from 10 eV to 1200 eV, in which our improved novel prototype cylindrical mirror analyzer (CMA) has been used. For the true kinetic energy calibration, the relative work function of sample to CMA was investigated by changing sample bias to CMA at ground level. It can be obtained by observing the onset of secondary electrons (SE) since SE are believed to begin just above “0” of vacuum level, although it is hardly possible to obtain a true spectrum.
著者関連情報
© 2002 by The Surface Analysis Society of Japan
前の記事 次の記事
feedback
Top