The 62nd JSAP Spring Meeting 2015
Session ID : 12a-A27-8
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 62
Location : [in Japanese]
Date : March 11, 2015 - March 14, 2015
Evaluation of low dopant concentrations using scanning nonlinear dielectric microscopy
*JUN HIROTA, MASAMUNE TAKANO, SHIRO TAKENO, HIROSHI AKAHORI, NORIMICHI CHINONE, YASUO CHO
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