JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 21p-P10-8
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The Correlation of electrical properties of Hall measurement and TEM observation on Al+ or N+ implanted SiC
*Kenichi YoshidaJunko MaekawaHitoshi Kawanowa
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© 2016 The Japan Society of Applied Physics
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