The 77th JSAP Autumn Meeting 2016
Session ID : 14p-P9-18
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 77
Location : [in Japanese]
Date : September 13, 2016 - September 16, 2016
Destructive Degradation Analysis for TO-247 Package SiC-MOSFETs Subjected to Thermal Cycle Test
*Sawa Araki, Tatsuhiro Suzuki, Mari Yamashita, Toshiaki Ohno, Hisashi Yakumaru, Hiroki Sawada, Satoshi Tanimoto
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