JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 64th JSAP Spring Meeting 2017
Session ID : 17a-301-6
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Defect Formation in SiO2 during the Thermal Oxidation of SiC
*Kenta ChokawaMasaaki AraidaiKenji Shiraishi
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© 2017 The Japan Society of Applied Physics
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