JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 64th JSAP Spring Meeting 2017
Session ID : 17a-301-11
Conference information

Anomalous behavior of gate current observed in FN stressed SiC-MOSFETs
Takafumi FuruichiYoshiki MiharaKazuki Masuguchi*Eiichi Murakami
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2017 The Japan Society of Applied Physics
Previous article Next article
feedback
Top