JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 65th JSAP Spring Meeting 2018
Session ID : 19p-C202-16
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Back-gate bias architecture for control of carrier injection in WSe2 FET
*Takamasa KawanagoHiroyuki TakagiRyo IkomaTomoaki Oba
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© 2018 The Japan Society of Applied Physics
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