JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 14a-B401-10
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Evaluation of GaN-MOSFET with different gate oxide deposition methods
*Satoshi IkedaTakashi OkawaHidemoto TomitaAtsushi WatanabeYutaka Tokuda
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Keywords: 14a-B401-10, GaN
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© 2020 The Japan Society of Applied Physics
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