抄録
Monte Carlo simulation that was controlled with nitrogen utilization rate and yield measurement error as a random value was done to enable discussion on using yield maps that were verified with a system for SSCM (Site-Specific Crop Management).
Smaller yield-measurement error resulted in decreased yield variations. However, if the error was less than 10%, this decrease was not that great. When the yield measurement error was larger than 20%, there was the possibility of decreasing it even more with a corrected Kriging value, taking spatial structural dependence into account. We also confirmed that repeating SSCM for a few years was much more effective in predicting yields than doing it for one year.
