Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21
Online ISSN : 2424-3086
ISSN-L : 2424-3086
会議情報
Noncontact Measuring Method of Pitch(Nano/micro measurement and intelligent instrument)
Masaharu KOMORIAizoh KUBOYoshihiro ODAYukihiro MATSUOKA
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会議録・要旨集 フリー

p. 335-338

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抄録
The pitch of machine parts influences its quality and therefore the quality control of pitch by precise measurement is demanded strongly in industries. The measurement of pitch is, however, usually time-consuming process if touch probe is used. Noncontact measurement is also used but it has difficulty in working distance or stability of measurement. In this report, a new noncontact measuring method of pitch is proposed. The image of surface of moving object is taken consecutively and the degree of focusing is evaluated for each image. The pitch is measured by analyzing the whole wave form corresponding to the change of focusing value. The principle of measurement is proposed and the fundamental experiment for pitch measurement is carried out.
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© 2005 一般社団法人 日本機械学会
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