抄録
Achieving a high areal density in magnetic recording systems necessitates reducing the physical dimensions of the head. However, this makes heads more susceptible to mechanical stresses generated during lapping. It is thus important to verify the durability of heads against lapping in order to achieve higher areal densities. However, it is very difficult to analyze the crystallography of potentially affected layers on the surface of a fabricated head due to its small size and because it is a part of a film stack. In this study, we develop an advanced verification method that uses ferromagnetic resonance to assess tunneling magnetoresistive (TMR) head durability against lapping.
