Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21
Online ISSN : 2424-3086
ISSN-L : 2424-3086
セッションID: B002
会議情報
B002 Construction of a surface profile measurement system by using a nanopipette ball probe with shear-force detection
Issei KodamaSo ItoWei Gao
著者情報
会議録・要旨集 フリー

詳細
抄録
The nanopipette ball probe is introduced for measuring three dimensional forms of micrometric structures. The shaft of the probe is made of glass pipette which has low Young's modulus in order not to damage the measurement object, and a micro glass ball is fixed to the tip of the shaft to measure in all directions. In addition, shear-force detection has been applied to detect approach of measurement object with low measuring force. In this paper, the basic property of the probe is evaluated, and dimensional form measurement is demonstrated by using the probe.
著者関連情報
© 2013 一般社団法人 日本機械学会
前の記事 次の記事
feedback
Top