Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21
Online ISSN : 2424-3086
ISSN-L : 2424-3086
2017.9
セッションID: 108
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High-Precision Measurement of Dielectric Microsphere Diameter Using Whispering Gallery Mode Resonance
Bohuai CHUKohei HAYASHIZheng ZHAOMasaki MICHIHATAKiyoshi TAKAMASUSatoru TAKAHASHI
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The accuracy of Micro-CMMs for three-dimensional shape measurement is influenced by the size and the shape of the probe sphere, whose diameter is often only about 50-100 μm. In order to measure the diameter of those microspheres precisely, a new method based on the analysis of an optical phenomenon called whispering gallery modes (WGMs) is proposed. In this paper, a high precision WGM resonance wavelength measurement of a standard deviation of 1 pm is achieved. Applying it to measure a microsphere whose diameter was about 55 μm, the measurement result showed that the precision of the proposed method was 3.1 nm.

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© 2017 The Japan Society of Mechanical Engineers
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