年次大会
Online ISSN : 2424-2667
ISSN-L : 2424-2667
セッションID: J112014
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J112014 Generation of overlap-scanning laser microscope moire fringes using micro grids for in-situ deformation measurement
Qinghua WANGSatoshi KISHIMOTOYoshihisa TANAKAKimiyoshi NAITOYutaka KAGAWA
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会議録・要旨集 フリー

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抄録
Overlap-scanning moire fringes are first generated under a laser scanning confocal microscope (LSCM). The moire fringes are caused by the superposition between two micro grid configurations in two scanning processes based on the memory function of the LSCM. After two confocal scanning processes, two grid configurations without image backgrounds can be remembered by the LSCM, respectively. The two grid configurations will be superimposed on the image background in the second scanning process when an image is recorded. If there is a mismatch or misalignment between the two grids in the two scanning processes, moire fringes will be observed. The formed moire fringes can be used to measure the in-situ deformation of materials at the micro-scale. The overlap-scanning laser microscope moire fringes extend the application scope of the LSCM in studying the mechanical behaviors of materials.
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