The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
I.01.1
Session ID : K-0722
Conference information
K-0722 Evaluation of Reliability for Build-up Printed Circuit Boards by Elastic-Plastic Thermal Stress Analysis
Takashi KONDOSakae KITAJOHirofumi NAKAMURA
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Abstract
A build-up layer resin is a key material for a high-density build-up board and its physical properties have a significant influence on reliability for a build-up board in thermal cycle stress testing. In this study, in order to estimate a lifetime of a build-up board from physical properties of a build-up layer resin, reliability for a build-up board was evaluated by elastic plastic thermal stress analysis using Finite Element Method.
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© 2001 The Japan Society of Mechanical Engineers
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