ポーラスゲル膜に生じるドメインウォール欠陥の座屈固有値解析

抄録

In this paper, we perform eigenvalue buckling analysis to investigate a defect of domain walls (DWs) in a diamond plate pattern (DPP), which is caused by swelling-induced pattern transformation in porous gel films. It is found that DWs in a DPP can be captured as long wavelength buckling. The critical stress of DWs in a DPP is higher than that of a uniform DDP, but as periodic units increase, both are identical. This means that this defect, i.e., DW, is hardly eliminated in DPPs. Further, the pattern of DWs consists of 4 basic buckling modes, which are obtained from extending the buckling mode of the DPP using the Bloch wave.