機械材料・材料加工技術講演会講演論文集
Online ISSN : 2424-287X
セッションID: 326
会議情報
326 薄膜の硬さ測定時に生じるくぼみ形状(OS 薄膜特性)
杉山 晋平金沢 憲一廣川 啓内糸 徹
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会議録・要旨集 フリー

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抄録
FEM computer simulation of the process which an indenter penetrates thin film during hardness test using ultramicro hardness tester is carry out to find out the ideal condition and effect of contact condition of interface between film and substrate. The main results are as follows, (l) Accurate ultramicrohardness of thin film is necessary to limit the plastic inside a thin film. (2) Weak contact of interface makes hardness lower. (3) The hardness test using the large-scale model is almost the same in FEM computer simulation.
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© 2001 一般社団法人 日本機械学会
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