抄録
Precise understanding of thermal contact resistance (TCR) is a key to improve a variety of thermal systems. Though it is fundamental to understand the TCR in nano or atomic scale, there have been reported very few experimental approaches to measure the TCR due to technical problems. We measure the TCR between carbon nanotube (CNT) and solid material (Pt, SiO_2) by using a new device of suspended sub-micrometer Pt hot-film. It is concluded that TCR between CNT tip and SiO_2 surface is 14% of thermal resistance of the CNT itself.
