熱工学コンファレンス講演論文集
Online ISSN : 2424-290X
セッションID: H134
会議情報
H134 接触熱抵抗の評価法に関する検討 : 低圧下での粗さを有する凸面間の接触(OS-3:電子機器・デバイスの熱課題(3))
富村 寿夫小糸 康志
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会議録・要旨集 フリー

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抄録
Heat transfer from electronic equipment with high packaging density or electric equipment with highly heated portions, not only heat conduction, convection, and thermal radiation but also thermal contact conduction is also involved, and those modes are coupled intricately. In order to make reasonable thermal countermeasure and design of such equipment, it is important to predict the thermal contact resistance accurately. In this study, the thermal contact resistance of solids with wavy rough surfaces has been investigated theoretically and experimentally under the low mean contact pressure of 0.1MPa to 1.0MPa.
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© 2013 一般社団法人 日本機械学会
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