熱工学コンファレンス講演論文集
Online ISSN : 2424-290X
セッションID: A234
会議情報
A234 スポット放射温度計による放射率と温度の同時計測(OS-7: 電子機器・デバイスの熱工学的課題と熱流動現象(5))
中村 元山田 俊輔
著者情報
会議録・要旨集 フリー

詳細
抄録

This paper presents a method for measuring the emissivity and temperature simultaneously by a spot infrared thermometer. Theoretically, it is possible to determine both the emissivity and temperature by providing the two ambient temperatures and measuring the corresponding outputs of the thermometer. To verify this, a simple experimental apparatus was fabricated having a hemisphere aluminum bowl to uniform the ambient temperature of the test surface. The ambient temperature was varied by the electric heating wire attached on the aluminum bowl. As a result, it was suggested that this measurement is possible if the emissivity was not less than about 0.5. Since various error factors were considered to exist in this measurement system, it is necessary to reduce the main factors to improve the measurement accuracy.

著者関連情報
© 2015 一般社団法人 日本機械学会
前の記事 次の記事
feedback
Top