主催: 一般社団法人 日本機械学会
会議名: 熱工学コンファレンス2016
開催日: 2016/10/22 - 2016/10/23
Recently, infrared thermographs are used frequently by electronic engineers in the design phase of electronic equipment. However, concerning the temperature measurement of a small-sized electronic component, the relation between the minimum area detectable of the peak temperature of an object and the area corresponding to one pixel of the detector of an infrared thermograph has not been known well. Therefore, in such cases, there is a possibility that a large error would occur. In this study, a simple method for estimating the peak temperature detection capability of the infrared thermograph has been proposed and discussed.