抄録
There are many kinds of techniques in X-ray stress measurement, each of which has its own advantage for practical purposes.
But there has been no investigation made so far evaluating the accuracy of various techniques of X-ray stress measurement.
In the present report, the measurements about an identically pulled specimen on the diffractometer by different kinds of the counter methods were performed and their resolving powers evaluated, the maximum intensity to back ground ratios, d values and stresses were obtained.
The results are as follows:
(1) The parafocusing method has higher resolving power and more than twice the diffraction intensity by the parallel beam method.
(2) By the parafocusing method with a specimen fixed, good results are not obtained.
(3) In practice, the parallel beam method and the θ-2θ method of parafocusing have good agreements with the applied stresses.
(4) By the θ-2θ methods by means of the parallel beam and by parafocusing method more exact stress values are obtained, and especially in the case of the parafocusing method the automatic focus tracing apparatus is needed.
