抄録
A common difficulty associated with high temperature (above 800°C) in-situ observation of matter in a SEM is the emissions of thermal electrons and light from a heating device and the heated specimen itself, obscuring the image and degrading the resolution. This difficulty was overcome by placing a thermal electron barrier that works as a light shield also.
By optimizing the design of testing jigs and these heat shields as well as the bias voltage, in-situ observations of propagation and self-healing of cracks in Si3N4 were successfully conducted at temperatures as high as 1200°C. Also, difference of the effects of moisture on static and cyclic fatigue crack propagations at room temperature was presented.
