Ga・1次イオンTOF-SIMSによる有機化合物の存在確認

抄録

In order to identify the existence and/or the structure of some organic compounds by Ga-primary ion TOF-SIMS, the collection and retrieval of spectra from references and standard materials have been performed as the case of IR and/or XRD. However, when the collection of correct SIMS spectra is not sufficient, the inference of fragment patterns of compounds to be identified is required. In this case, it was recognized that the roles of chemical parameters like bonding energy between radicals, electron affinity of atoms and radicals, and so on were important; and for the present, the construction of the so called general analytical procedure applicable to almost all organic compounds was difficult to establish.